配件--双端口探针系列详细介绍
产品特点
用有SS,GSSG,GSGSG等配置
Provide the SS,GSSG,GSGSG probe tip configuration.
可满足晶圆差分性能测试。
Wafer differential performance can be measured
深针频率覆盖40GHz,50GHz,67GHz110GHz
Frequency reach 40GHz,50GHz,67GHz,110GHz
具有良好的针尖可见性划痕,用于晶圆级精度测量.
Excellent tip visibility and scratches for wafer levelprecision measurement.