满足器件集成度大幅增长要求,具有超越E5071C的器件S参数表征特性的更完整测试性能,以及高达53GHz的更灵活射频/微波测量功能,为研发和制造测试应用提供更全面解决方案。
KEYSIGHT E5080B ENA矢量网络分析仪
HIGHLIGHTS The New Standard
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 20 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
Wide frequency coverage from 9 kHz to 4.5/6.5/9/14/20 GHz
Fully capture device performance with a wide dynamic range of 140 dB
Achieve complete device characterization with optional built in DC sources, bias tees, pulse generators and pulse modulators
Consistently test between R&D and production with the same UI and SCPI commands as high-end PNAs.
Improve throughput by performing spectrum analysis, pulsed-RF measurements, vector mixer measurements, noise figure, and more on a single instrument
INTEGRATED FUNCTIONALITY
The E5080B eliminates the cost and complexity of multiple instruments. Integrated hardware capabilities for a wide range of tests turn the E5080B into a complete measurement solution.
The E5080B's options include:
DC sources
Pulse generators and modulators
Spectrum analysis
Noise figure measurements